Non spherical measuring instrument

Evolution of specifications for mobile phone lenses
The global smartphone market is rapidly growing, driving the demand for mobile phone lenses. Its mainstream specifications have been upgraded from VGA level to 2 million, 3 million, 5 million, and 8 million pixel levels. By 2012, including Apple, Samsung Electronics, HTC, Sony Mobile Communications, as well as mainland smartphone manufacturers such as ZTE, Huawei, and Yulon, the mainstream rear lens models promoted by high-end mainstream models have all entered the 8 million pixel level. Some manufacturers have also tried to launch models with 12 million, 13 million, and 16 million pixel levels to test market trends.

Lens design is becoming increasingly complex, requiring finer tolerances

The non spherical shape error has increased from 10um in VGA to 0.05um in 16 million pixels

Institutions are becoming increasingly complex, and the required dimensional errors have shifted from the "bar" level in the past to um level, and even sub um level

There are more and more uncertain factors, and the yield rate is also decreasing

Compass - a new concept of non-contact non spherical measuring equipment

1. Full 3D non-contact non spherical measuring equipment
2. Low noise has almost no errors caused by scratches and vibrations in contact measurement equipment
3. There is no track error caused by measuring upward/downward in contact measurement
4. There is no correction error caused by the R value error of the measuring probe in contact measurement
5. There is no large angle aberration caused by the correction of non spherical outer edges using spherical probes in contact measurement
6. Compass provides measurement of lens surface PV and size
7. 1.4k x1.4k@300Hz Ultra high CCD resolution

Compass performance outstanding performance:

Compass provides 5-axis stages that can be rotated to any angle for measurement, ensuring no blind spots in the measurement
2. The measurement obtains full 3D data without any central orbit deviation issues
3. Non contact white light measurement, there will be no need to correct the probe R value, no Tip radius error in the measurement results, and no consumables caused by probe breakage
4. The measurement range is within the high-precision Pizeo range, with a Z-axis resolution of up to 0.01nm,
Reproducibility of 0.008nm RMS