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Phone
18017373226
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Address
Room 703, South Building, Jinmao Garden, 2515 Pudong Avenue, Pudong New Area, Shanghai
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Shanghai Pulangyuan Precision Electromechanical Co., Ltd
3D optical surface profilometer
NegotiableUpdate on 02/08
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Overview
The NexView Optical Profile 3D optical surface profiler can achieve sub nanometer level measurement accuracy regardless of the field of view range. Can measure flatness, roughness, large steps, thin films, steep slopes, etc
Product Details
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Nexview ™3DOptical surface profilometer NexView3D1Optical surface profilometers are skilled at measuring the microscopic morphology of various surfaces, ranging from ultra smooth to very rough surfaces, and can accurately measure them. Regardless of the field of view, sub nanometer level measurement accuracy can be achieved. It can measure flatness, roughness, large steps, thin films, and steep slopes. The testing scope ranges from less than20000Nano to |
Microns.
SiC mirror: crystal features and polishing marks can be clearly seenMxInterface
(Click on the image to enlarge)
A cone angle of 120 degrees
Single point diamond cutting surface
Automatic 200mm integrated measuring platform•
Super strong testing range
It can test all types of surfaces, from rough to super smooth, including thin films, steep slopes, and large steps.•
Measurement Capability Reflected
Superior accuracy and repeatability can meet the rigorous testing requirements•
Seismic technology
Can work normally in almost any environment•ISO 25178
International standard for surface measurement•
A workflow software with a brand new layout
More powerful functions, easier to operate and learn•
Streamlined design
No manual operation required, fully automated control
The only profiler needed
You no longer need to choose a profilometer based on the type of surface you want to measure. The NexView profilometer can measure almost any surface morphology, from sub angstrom level ultra smooth surfaces to steep mechanical parts up to 85 degrees, all using 3D, non-contact measurement, overcoming the shortcomings of other measurement techniques (probe based, confocal, focused scanning), and providing the best metrological detection solution
New analysis and control software
The NexView profilometer utilizes the all-new Mx (TM) software to enhance the control and analysis of the entire system, including rich interactive 3D images, quantitative morphology information, intuitive measurement navigation, and embedded SPC with data statistics, control charts, and pass/fail limits.•interactive3Dpicture
- Zoom, panorama, rotation, and real-time updated results.•Flexible analysis tools
- Contains a large number of quantitative results, data views, and filtering.•Superior analytical tools
- Provides a free layout area for data investigation, manipulation, and measurement comparison.•Intuitive user interface
The process oriented design makes the software easy to learn and operate.•Floating toolbar
- Can be freely set to meet your workflow.
For special testing requirements, the software has dedicated application modules, such as measurement of transparent films and 2D visualization analysis, which are very helpful for users in need.
automation
The NexView profilometer does not require manual operation and is fully automatic and electrically controlled, allowing for multiple sequential automatic measurements using software. It can perform programmed automatic measurements on clamped samples and quickly assemble large samples.
