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Huace Insulation Resistance Degradation Assessment System

NegotiableUpdate on 02/15
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Overview
The insulation resistance degradation (ion migration) evaluation system of Huace Instrument refers to the ionization of metals such as copper, silver, tin, etc. on the circuit board under certain conditions and their migration towards the other pole through the insulation layer under the action of an electric field, resulting in a decrease in insulation performance. The insulation resistance degradation (ion migration) evaluation system is a reliability testing equipment. Huace Insulation Resistance Degradation Assessment System
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Insulation resistance degradation (ion migration) assessment system

Evaluate the degree of degradation and ion migration phenomenon of insulation materials


华测绝缘电阻劣化评估系统


Huace InstrumentInsulation resistance degradation (ion migration) assessment systemProduct Introduction

Ionic migration refers to the ionization of metals such as copper, silver, tin, etc. on a circuit board under certain conditions and their migration towards the other pole through the insulation layer under the action of an electric field, resulting in a decrease in insulation performance.Insulation resistance degradation (ion migration) assessment systemIt is a reliability testing device. It applies a fixed DC voltage on a printed circuit board and undergoes long-term testing(1~1000 hours can be customized as needed), observe whether there is a momentary short circuit in the circuit, and record the change in resistance value to evaluate the degree of insulation material degradation and the impact of ion migration phenomenon.


Huace InstrumentInsulation resistance degradation (ion migration) assessment systemApplication fields:

Packaging materials: flux, printed circuit board, photoresist, solder, resin, conductive adhesive and other materials related to printed circuit board and high-density packaging;

Electronic materials: printingFine pitch IC packages such as BGA and CSP;

Organic semiconductors:PPV, NDI, OFETs, OSCs, OLEDs, etc;

Electronic components: capacitors, connectors, and other electronic components and materials;

Insulation materials: Evaluation of moisture absorption characteristics of various insulation materials.


Technical Specifications:

measure voltage100~1500V (customizable)

test channel128 channels (customizable up to 960 channels)

Test duration:Can run continuously1500 hours

Test temperature:85 ℃ (customizable)

Test humidity:85% (customizable)

Measurement range:1×105~1×1015Ω

Polarization voltage:100~1500V (customizable)

Scanning cycle:fastest2 minutes (128 channels)


constant temperature test chamber

Model:HC-80 Temperature range:RT ~ +100℃ Internal volume(L)80

Model:HC-512 Temperature range:RT ~ +200℃ Internal volume(L):512


Mini high and low temperature environmental box

Model:HC-35 Temperature range:-40 ~ +100℃ Internal volume(L)35

Model:HC-70 Temperature range:-70 ~ +200℃ Internal volume(L)70

华测绝缘电阻劣化评估系统

华测绝缘电阻劣化评估系统