High temperature insulation resistance testing platform for semiconductor packaging materials

The high-temperature insulation resistance testing system for semiconductor packaging materials has been designed with multiple safety measures for the insulation material resistance evaluation platform. During the testing process, it ensures the safety of the testing process under abnormal conditions such as overvoltage, overcurrent, and overtemperature; The data storage mechanism allows for the storage of data in the controller in the event of a computer malfunction or momentary power outage, without losing test data. The device can be restarted to restore the original test data.