Dutch ASI detector camera for transmission electron microscopy electron diffraction

Cheetah：High performance detector for transmission electron microscopy electron diffraction

ASI's Cheetah is a hybrid pixel detector (TEM ED Detector Camera) suitable for electron microscopy applications. Cheetah's outstanding sensitivity and speed provide unprecedented possibilities for obtaining electron diffraction, imaging, and tomography scans. Each pixel is connected to the readout electronics integrated on the chip through bump bonds, with the chip located below the sensor. The electronic components of each pixel process the signal from the sensor of that pixel separately. Each independent pixel counts and processes events detected in its corresponding area.conventionscintillatorCCD detectors cannot detect weak signals with noise levels, while Cheetah can obtain them. Compared with other types of direct detector cameras, Cheetah has a very large dynamic range and high electron beam sensitivity, and is commonly used in diffraction experiments. The high-speed characteristics of Cheetah make it an ideal tool for observing dynamic processes and capturing rapidly decaying signals.

Advantages of detectors:

1) ASI's new ultra high sensitivity detector provides a solution for studying micro - and nano scale crystals through electron diffraction, and can be installed at the bottom of existing transmission electron microscopes or on the side. High sensitivity, high readout rate, and wide dynamic range enable users to collect data far beyond the limitations of CCD and CMOS cameras. For (4D) STEM applications, this means the ability to quickly scan large areas.

2) The multifunctional design makes our detector backward compatible with almost all electron microscopes and can be further adjusted to meet new user needs.

3) X-ray crystallography is the most commonly used method for determining the atomic structure of proteins and other beam sensitive materials. To obtain high-resolution X-ray data, a relatively large crystal is usually required. However, in many cases, only crystals at the micrometer or nanometer scale are grown. Recent research results indicate that micro - and nano scale crystals can be studied using TEM electron diffraction.

Characteristics of Mixed Pixel Technology:

Direct, single photon detection

Excellent point spread function

Zero noise(>3 keV)

Short readout time and high-speed frame rate

By using highZ material sensor can increase high-energy efficiency

Modular detectors can adapt to large-area detection systems

application area:

Energy resolutionX ray

Computerized tomography (CT) scan

Rapid production linex-ray examination

Transmission electron microscope（TEM ED）

mass spectrum

Single photon imaging

Neutron and electron imaging

Model and configuration:

For nonTEM applications, such asXApplications such as X-ray detection, imaging, and tomography，selectableLynX series hybrid pixel X-ray detectorIn addition,ASI also providesTPX3CamType nanosecondFast optical detector for photon timestamp，It is based on aIncreasing photosensitivityA new type of silicon pixel sensor, combined withTimepix3 ASIC and readout chip technology, suitable for various applications requiring time-resolved imaging such as electronics, ions, or single photons.