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Shanghai Haokuo Scientific Equipment Co., Ltd
Taisi Ken's new generation ultra-high resolution field emission scanning electron microscope
NegotiableUpdate on 03/06
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Overview
The newly designed CLARA ultra-high resolution field emission scanning electron microscope from Taisi Ken can provide unparalleled image quality and powerful extended analysis capabilities, meeting all the needs of industrial research and development. It is not only suitable for high-end nano analysis applications, but also brings comfortable and efficient user experience to operators.
Product Details
CLARANew generation ultra-high resolution field emission scanning electron microscope
Product Introduction
Newly designedCLARAUltra high resolution field emission scanning electron microscopy can provide unparalleled image quality and powerful extended analysis capabilities, meeting all the needs of today's industrial research and development. It is not only suitable for high-end nano analysis applications, but also brings comfortable and efficient user experience to operators.
Product Features
- The new generation of in tube electronic acceleration and deceleration technology ensures the low voltage and high-resolution observation capability of complex samples.
- Static electricity configured for the first time-Electromagnetic composite objective lens, with no magnetic field leakage, achieves high-resolution imaging and analysis of magnetic samples.
- to configure4A new generation detector that can achieve9Image observation provides a more comprehensive collection of sample information.
- Configure a large sample room with over20An extension interface has created a favorable working environment for in-situ observation and analysis.
- Can be configuredTESCANMultiple extended analysis attachments, whether self owned or third-party, such asEDS、EBSD、CL、RamanCombined use.
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