Oxford X-Strata920 Fluorescence Coating Thickness Measurement Spectrometer

Product Description

X-Strata920
Fast and reliable X-ray fluorescence coating thickness measurement and material analysis, low cost and high efficiency!Fast and precise analysis: Combining a large-area proportional counting detector with an Oxford Instruments 50 watt micro focused X-ray tube (with high X-ray beam intensity, small spot size, and excellent sample excitation) provides optimal sensitivity

Oxford Instruments - a brand you can trust!
●From research and development, production, sales to service, Oxford Instruments Company specializes in coating thickness measurement and compositionWith over 20 years of rich experience in the field of analysis, we provide customers with high reliability, low cost, andEfficient solutions
●We have sold over 3000 desktop X-ray fluorescence coating thickness gauges worldwide

			X-ray fluorescence (XRF) method The working principle of X-ray fluorescence (XRF) instrument is to emit a single X-ray to the tested sample, which is the original source of the sampleAfter absorbing the energy of X-rays, it is excited and releases secondary X-rays. Each chemical element releases a specific substanceX-rays of energy. By measuring the characteristic energy and intensity of these released secondary rays, X-rays are divided intoThe analyzer can provide qualitative and quantitative analysis of the coating thickness and composition of the tested material. Advantages of X-ray Fluorescence Analysis： ● Less or no need for sample preparation Non destructive analysis ●Wide range of measurable elements: Tito U92 ●Can analyze solids and solutions Quick analysis: Get results within seconds ●Qualitative, semi quantitative, and fully quantitative analysisAnalysis ● Easy to operateJust need simple training ●The X-ray fluorescence standard testing method, specifications, and operating instructions are globally applicable and can improve product quality Safety, ease of market access and trade, and enhanced customer confidence. For example: X-Strata920 complies with: ASTM B568: Standard test method for measuring coating thickness using X-ray spectrometer ISO 3497: Metallic coatings - Measurement of coating thickness by X-ray spectroscopy
	Electronic industry Electronic and electrical components Effectively control the production process and improve productivity Ensure component reliability -Simultaneously measure the composition of solder alloy and coating thickness Optimize quality control to ensure product lifecycle For example: Analyzing the thickness of conductive coatings of gold and palladium Measure the thickness of the NiP layer on a computer hard drive

Hardware electroplating industry Hardware electroplating Reduce the cost of electroplating treatment and increase the output ●Quick and simple analysis Simultaneously apply single-layer or multi-layer coating thickness ●Measurement and component analysis One * multiple can analyze 4 layers of coating Composition analysis of plating solution		Metal alloy industry Composition analysis and grade identification of metal alloys Rapid non-destructive analysis of jewelry and other alloys ●Analysis of Precious Metal Alloys ●Gold purity analysis ●Material identification

X-Strata920 high-performance X-ray fluorescence spectrometer
● Fast and accurate analysis: Combining a large-area proportional counting detector with an Oxford Instruments 50 watt micro focused X-ray tube (with high X-ray beam intensity, small spot size, and excellent sample excitation) provides optimal sensitivity
● Simple element differentiation: Separate overlapping spectra of elements through secondary ray filters
● Performance optimization, with a wide range of analyzable elements

X-Strata920's sturdy and durable design: ● Can be operated in the laboratory or on the production line ● Robust industrial design Simple calibration steps: When there is no calibration sample, the Basic Parameter Method (FP) provides simple and reliable quantitative analysis results The empirical coefficient calibration method provides excellent accuracy and result traceability, and only requires a small amount of standard samples The method establishment only takes a few minutes Oxford Instruments provides certified standard samples (A2LA and ISO/EC 17025 certified) to ensure accuracy X-Strata920 comes pre installed with over 800 easily selectable application parameters/methods: Excellent long-term stability: The automatic thermal compensation function measures the temperature changes of the instrument and makes corrections to ensure stable test results Routine simple and fast spectral calibration can automatically check instrument performance (such as sensitivity) and make necessary corrections X-Strata920 avoids bias in the results of different operations Laser focusing: Simple "fixed-point button" operation to focus the sample Fixed focal length height: 0.5" (12.7 mm) . X-Strata920 can analyze samples of different shapes and sizes

X-Strata920Three configuration options

To meet your analytical needs

deepenSample stand ● Height every half inch (12.7mm) Adjustable, architecture based sample chamber can accommodate Na * Large Height 6.3 "(160mm) The sample

Fixed sample stage ● Fixed position of sample table Economic and practical ● Flat sample table design, suitable for high Samples with a degree not exceeding 1.3 "(33mm) Product analysis

Programmable Sample Stand Used for automated measurement ● Convenient to place samples according to the testing location, And accurately locate the measurement points Sample table size: 22"(D) x 24"(w), 560mm (depth) x 610mm (width) ● Movement distance of programmable control station: 7"x7", Namely 178mm x 178mm

Advanced system security ●Set simple and functionally limited settings for daily operators user interface ●Administrator level access to the system for maintenance ●System usage is logged in by the operator ●Automatic locking function prevents unauthorized operations

Result output ●The results can be exported to an Excel spreadsheet or report ●Generate custom ●Users can customize the statistical analysis format ● Including statistical analysis data ● Obtain sample images and include them in the report