- Phone
-
Address
Room 707, Aiqian Building, 599 Lingling Road, Xuhui District, Shanghai, China
Product Categories
- ALL
- NX-3DM Rotating Fully Automatic Atomic Force Microscope
- Nano observer electrical atomic force microscope
- Cathodic Fluorescence Imaging Spectral Detection System
- EM-AFM electron microscope in situ atomic force microscope
- Multi functional maskless laser direct writing
- SERS chip substrate
- Optical surface defect analyzer
- Maskless laser direct writing
- Explorer Electron Beam, Magnetron, Thermal Evaporation Thin Film Deposition
- DV-502 Thermal Evaporation Thin Film Deposition
- Desktop Pro Thin Film Deposition - Magnetron Sputtering
- BenchTop Turbo Thermal Evaporation and Sample Preparation
- Desk V Thin Film Deposition Solution
- Hyperspectral microscope
- Freeform Surface 3D Shape Tester
- Wafer warpage stress measuring instrument
- Internal stress detector
- Semi automatic wafer bonding machine
- proximity aligner
- Array pressure sensing system
- Atomic layer deposition system ALD products
- CMP20 electrochemical mechanical polishing machine
- Electron microscope sample cleaning machine
- VITA reactive ion etching machine (vertical chamber)
- Laser interference lithography machine
- COWIN High Throughput Integrated Plasma Reaction Ion Etching Cleaning System
- LAVIDA Paraxylene Coating Equipment
- Co series desktop plasma etching machine cleaning machine
- Liquid particle size analyzer
- CLONE dual-mode plasma etching machine cleaning machine
- EzAFM portable atomic force microscope
- Laser sampling
- Precision glass cutting machine (desktop type)
- Liquid Particle Sizer - LPC
- ADR low-temperature constant temperature dry mK system
- High temperature 3D printer
- Block resistance tester
- NX12 Biological Atomic Force Microscope
- S100 type digital source table
- Zeta-388 automatic multi-mode optical profilometer
- TS200-HP high-power probe station
- Zeta-300 multi-mode optical profilometer
- TS50 manual small probe station
- TS2000-DP high-power probe station
- TS2500-RF Fully Automatic RF Probe Station
- TS3000 automatic probe station
- MicroXAM800 White Light Interferometer
- MDO34 oscilloscope
- TS300 12 inch manual probe station
- In situ AFM in SEM
Shanghai Nateng Instrument Co., Ltd
