STI5000C Power Device IV Characteristic Curve Analyzer

NegotiableUpdate on 04/22

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Automatically generate I-V curves (standard characteristic curves) of power devices. It has a wide range of applications in failure analysis. The new name is STI5000C curve tracker. The product performance curve has been put into use in numerous research and development laboratories, incoming material inspection centers, as well as major scientific research institutions and university laboratories, and is known for its accurate and rapid responsiveness. The currently used 16 bit analog-to-digital conversion has further improved resolution, with RDSON's resolution being in the micro European range. The new name is STI5000C curve tracker. The product's performance curve is currently available in many five companies

Product Details

STI-CURVE TRACE softwareWhen used in conjunction with the ST5000 testing host, it can automatically generate I-V curves (standard characteristic curves) of power devices. It has a wide range of applications in failure analysis. The new name is STI5000C curve tracker. The product performance curve has been put into use in numerous research and development laboratories, incoming material inspection centers, as well as major scientific research institutions and university laboratories, and is known for its accurate and rapid responsiveness. The currently used 16 bit analog-to-digital conversion has further improved resolution, with RDSON's resolution being in the micro European range.

Standard characteristic curve:
Mosfet (N-Channel & P-Channel)
ID vs. VDS at range of VGS
ID vs. VGS at fixed VDS
IS vs. VSD
RDS vs. VGS at fixed ID
RDS vs. ID at several VGS
IDSS vs. VDS
Transistor (NPN & PNP)
HFE vs. IC
BVCE(O,S,R,V) vs. IC
BVEBO vs. IE
BVCBO vs. IC
VCE(SAT) vs. IC
VBE(SAT) vs. IC
VBE(ON) vs. IC (use VBE test)
VCE(SAT) vs. IB at a range of IC
VF vs. IF