Park NX10 Atomic Force Microscope

The ideal choice for innovative research

Park NX10 brings you high-precision nanoscale resolution data, which is worthy of your trust, use, and ownership. Whether it's sample setup or full scan imaging, measurement, and analysis, Park NX10 can ensure that you focus on innovative research workSimultaneously providing high-precision data.

high-precision measurement

·Low noise Z-detector can accurately measure the surface morphology of atomic force microscopy

·Accurate XY scanning by eliminating scanner crosstalk

·True Non ContactTM mode ensures optimal probe lifespan, high-resolution scanning, and sample protection

·Personalized design of hardware and software functions

Low noise Z-detector for Park NX10 atomic force microscope

The Z-axis detector is one of the core technologies of the new NX series atomic force microscope. It is Park's innovative strain sensor. With a low noise of 0.2 angstroms, it has become one of the low-noise Z-axis detectors in the industry. The low noise allows the Z-axis detector to serve as the default morphology signal, and the differences between the new NX series atomic force microscope and previous generations can be easily observed. If the noise of the Z-axis detector is too high, users cannot observe the atomic steps of the sapphire chip. The height signal emitted by the Z-axis detector of the Park NX series atomic force microscope has the same noise level as the Z-axis voltage waveform.

Simple probe and sample replacement

The proprietary design allows you to easily replace new probes and samples from the side by hand. With the pre aligned cantilever in the installation cantilever probe chuck, there is no need for complicated laser calibration work.

Lightning fast automatic proximity needle

The automatic probe sample insertion function allows users to operate without intervention. By monitoring the reaction of the cantilever approaching the surface,Park NX10 can start and automatically complete the probe sample needle insertion operation within ten seconds after cantilever loading. The fast information feedback of the high-speed Z-axis scanner and the low-noise signal processing of the NX electronic controller enable quick contact with the sample surface without user intervention.

Park NX10 Technical Parameters

scanner

Z scanner

Flexible guided high thrust scanner

Scan range: 15 µ m (optional 30 µ m)
High signal noise level: 30 pm
0.5 kHz bandwidth, rms (typical)

XY scanner

Flexible guidance of closed-loop controlXY scanner

Scan range: 50 µm × 50 µm
(可选10 µm × 10 µm 或 100 µm × 100 µm)

Drive table

Z displacement table travel range: 25 mm (Motorized)
Focus on the travel range of the sample stage: 15 mm (Motorized)
XY displacement table stroke range: 20 mm x 20 mm (Motorized)

Sample Holder

sample size:open space up to 100 mm x 100 mm， 厚度 up to 20 mm
sample weight :< 500=''>

optics

10x (0.23 N.A.) ultra long working distance lens (1 µ m resolution)
Visual coaxial imaging of sample surface and cantilever
vision480 × 360 µ m (with 10x objective lens)
CCD: 1 million pixels, 5 million pixels (optional)

software

SmartScan™

Specialized software for AFM system control and data acquisition
Quick setting and easy imaging of intelligent mode
Advanced use of manual mode and more precise scanning control

XEI

AFM data analysis software

electron

Integrated functions

4-channel digital lock-in amplifier
Elastic coefficient calibration(Hot method, optional)
dataQ Control

Connect external signals

20 embedded input/output ports
5 TTL outputs: EOF, EOL, EOP, modulation, and AC bias