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Leica EM RES101 multifunctional ion beam grinder

NegotiableUpdate on 04/05
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Leica EM RES101 multifunctional ion beam grinder
Product Details

Multi functional ion beam grinder Leica EM RES101

Leica EM RES101 is a fully computer-controlled ion beam milling system with extremely high user flexibility, allowing for the preparation of TEM, SEM, and LM samples with just one device.
Leica EM RES101 performs ion milling with adjustable direction from 0 ° to 90 °; The energy of the ion source is variable and can be used for high-energy or low-energy ion beam grinding. Equipped with a built-in CCD camera, it can observe the entire sample processing process. And equipped with an exchange pre extraction chamber to ensure a long-lasting high vacuum in the sample chamber.
advantage

sample preparation

Suitable for preparing samples for transmission electron microscopy and scanning electron microscopy, without the need for two different instruments in the laboratory, resulting in cost savings.

LAN compatibility

Through the local area network, users can manipulate and monitor the sample processing process externally, providing users with great flexibility and convenience.

Liquid nitrogen freezing system

The optional LN2 cooling system uses a specialized sample stage made of Cu material to ensure that the samples are truly cooled, so that there is no false image generated during sample processing of heat sensitive samples. It is suitable for TEM and SEM sample processing, making the methods for processing different types of samples more flexible and versatile.

Fully automatic multifunctional ion beam grinding system, capable of ion thinning (for TEM); Ion beam polishing, ion etching, sample ion cleaning, and slope cutting (for SEM), etc

Ion beam energy 1keV 10keV, 2 ion guns can be tilted ± 45 ° respectively, sample stage tilt angle -120 ° to 210 °, ion beam processing angle 0 ° to 90 °, sample plane swing angle<360 °, vertical swing distance ± 5mm

Maximum sample size that can be accommodated: diameter 25mm, height 12mm

Optional sample stage: TEM sample stage (Ø 3.0mm or Ø 2.3mm), FIB sample cleaning stage, SEM sample stage, slope cutting sample stage (for 35 ° or 90 ° slope cutting of samples) and corresponding frozen sample stage

Oil free vacuum system, sample chamber with pre pumping chamber, ensuring sample exchange time<1 minute

Fully computer-controlled, touch screen operation interface, built-in video observation system, capable of real-time observation of the sample production process