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Leica DMi8 inverted metallographic microscope

NegotiableUpdate on 03/30
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Overview
Leica DMi8 Inverted Metallographic Microscope 2018/06/07 Leica DMI8 Inverted Metallographic Microscope observes samples in detail. Do you need to observe large-sized samples and conduct detailed analysis? The macroscopic objective lens provided by Leica Microsystems allows you to observe more sample details in a shorter amount of time. With just one click, you can switch from macro mode (35 mm) to nano mode (1 nm). The Leica macro objective provides a field of view four times that of a standard objective (observing the overview of a 35.7mm sample at 0.7x magnification). You can switch between different magnifications: -0.7x -5x -10x -20x -50x -100x -, and illuminate the sample from different angles. The 3-speed focusing driver can achieve sensitive and adjustable focusing at different magnifications, thereby improving your sample detection efficiency. Use the UC-3D illumination device to observe more details. Leica Microsystems provides a super contrast 3D illumination device. It can illuminate the sample from different angles to help you obtain more surface structure information and achieve higher contrast. Therefore, you can observe more sample details in a shorter amount of time. The built-in lighting solution brings a more relaxed user experience .....
Product Details

Leica DMI8 inverted metallographic microscope observes samples in detail
Do you need to observe large-sized samples and conduct detailed analysis? The macroscopic objective lens provided by Leica Microsystems allows you to observe more sample details in a shorter amount of time. With just one click, you can switch from macro mode (35 mm) to nano mode (1 nm).
The Leica macro objective provides a field of view four times that of a standard objective (observing the overview of a 35.7mm sample at 0.7x magnification).
You can switch between different magnifications: -0.7x -5x -10x -20x -50x -100x -, and illuminate the sample from different angles.
The 3-speed focusing driver can achieve sensitive and adjustable focusing at different magnifications, thereby improving your sample detection efficiency

Use UC-3D lighting device to observe more details
Leica Microsystems provides ultra contrast 3D illumination devices. It can illuminate the sample from different angles to help you obtain more surface structure information and achieve higher contrast. Therefore, you can observe more sample details in a shorter amount of time.
Built in lighting solution brings a more relaxed user experience
No additional cost required to obtain more sample information
You can choose Leica manual or electric version
  

technical specifications
1. High intelligence digital inverted metallographic microscope
2. Multi color correction optical path, the overall optical path supports a field of view diameter of 25mm
3. 6-hole electric objective disc, compatible with 32mm diameter objective lens
4. Built in manual or electric tuning system, electric focusing accuracy of 0.015um
5. Can achieve semi/fully automatic bright field, dark field, polarization, interference UC-3D、 Fluorescence observation method
6. The body is equipped with LED transparent and reflective lighting power supply, and the intelligent control lighting mode for light intensity changes
7. Ergonomic observation tube, capable of changing tilt angle from 15 ° to 46 °
8. Automatic memory of light sources under different objective lenses and observation modes, intelligent control of lighting intensity changes
 
9. The machine base is equipped with an LCD display screen to show the working status and parameters of each component of the microscope
10. The light intensity, aperture, observation mode, and spotlight adjustment can be controlled by buttons and computer operation, and corresponding magnification scales can be automatically added to photos taken under different magnification objectives. The system has a constant color temperature, providing work efficiency
11. Can be equipped with cameras, digital cameras for image acquisition, analysis, and measurement
12. Can be paired with an automatic scanning table for automatic analysis of non-metallic inclusions in multiple fields of view