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E-mail
emkete@emcrafts.com.cn
- Phone
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Address
Building 25, No. 9 Anningzhuang West Road, Haidian District, Beijing
Platinum (Beijing) Technology Co., Ltd
emkete@emcrafts.com.cn
Building 25, No. 9 Anningzhuang West Road, Haidian District, Beijing
·Leica DM 6M upright metallographic microscope, fully automatic intelligent digital upright metallographic microscope, suitable for observation and analysis of samples such as metals, ceramics, polymer materials, electronic components, dust particles, etc
·Modular design, capable of realizing reflection observation and transmission reflection observation configuration
·Multi color correction optical path, the overall optical path supports a field of view diameter of 25 mm
·6-hole electric objective disc, compatible with 32mm diameter industrial objective lens
·Built in electric focusing system with an accuracy of 0.015um
·Can achieve fully automatic bright field, dark field, polarization, and interference observation methods
·The body is equipped with a built-in 12V100W transparent and reflective lighting power supply, and an intelligent lighting control method for changing light intensity
·Capable of automatically remembering the combination of light intensity, aperture size, and condenser lens under different objective lenses and observation modes, automatically restoring them to their original positions, with simple and fast operation
·Large size color LCD display screen displays the working status and parameters of various components of the microscope, and can touch control the operation of the microscope
·The adjustment of light intensity, aperture, observation mode, and spotlight can be controlled not only by buttons, but also by computers
·Automatically add corresponding magnification scales to photos taken under different magnification objectives
·Equipped with a constant color temperature system to improve work efficiency
·Can be equipped with cameras and digital cameras for image acquisition, analysis, and measurement.
·Can be equipped with fluorescence observation, high-temperature hot table, cathodoluminescence analyzer, photometer
·Can be connected to 4x4, 6x6 large sample tables for observing large-sized samples such as silicon wafers
·Can be paired with an automatic scanning table for multi field non-metallic inclusion analysis and particle size and cleanliness analysis