High acceleration test

NegotiableUpdate on 06/12

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Radio and Television Metrology has high-performance HALT&HASS test chambers, which can conduct HALT tests according to your requirements, use high environmental stress to stimulate product design defects, understand product design capabilities and failure modes, eliminate design defects, identify product working limits and failure limits, develop HASS plans, provide a basis for determining the stress level of HASS, and greatly improve product reliability.

Product Details

High Accelerated Life Testing (HALT) is a process that uses a rapidly changing oscillation system between high and low temperatures to reveal design defects and deficiencies in electronic and mechanical components. The purpose of HALT is to identify the functionality and destructive limits of a product in the early stages of development, in order to optimize its reliability. HALT is not a qualified or unqualified test, but a tool to assist design engineers in improving product reliability. There is no pre-set limit, and the limit is determined by the product, gradually increasing stress until failure. During the test, the product needs to be monitored. HASS (Highly Accelerated Stress Screening) is a high acceleration stress screening performed on products after obtaining the operating or failure limit value through HALT testing, where the stress is lower than that of HALT testing.

Radio and Television Metrology has multiple HALT test chambers, all of which are imported Qualmark brand, capable of conducting Halt/Hass tests, including low-temperature step stress test, high-temperature step stress test, vibration step stress test, rapid thermal cycle test, and comprehensive stress test. During these test processes, working stresses such as product on/off, voltage offset, frequency pull offset, etc. are often accompanied.

Scope of application:

Halt/Hass testing can be conducted for modules, communication terminals, components, and complete machines of electrical and electronic, instrumentation, automotive, and aerospace products.

Testing standards:

GB/T 29309；

DKBA1141 "HALT Test Specification for Communication Products".

Experimental project:

HAlt test type	General conditions of the experiment	Application situation
Low temperature step stress	1. Start the test at room temperature or the temperature point specified in relevant regulations as the starting temperature; 2. Cooling is carried out in a certain temperature step, usually 10 ℃; 3. The retention time should be at least 10 minutes+stabilization time+functional performance testing time; 4. Gradually increase until reaching the basic technological limitations.	Widely used



High temperature step stress	1. Start the test at room temperature or the temperature point specified in relevant regulations as the starting temperature; 2. Heating up at a certain temperature step, usually 10 ℃; 3. The retention time should be at least 10 minutes+stabilization time+functional performance testing time; 4. Gradually increase until reaching the basic technological limitations.	Widely used



Rapid thermal cycling test	1. Determine the high temperature and low temperature values based on the results of high temperature step stress and low temperature step stress; 2. Temperature cycling tests should be conducted at a certain rate of temperature change, and it is generally recommended to use 40 ℃/min or 60 ℃/min; 3. The high and low temperature retention time should be at least 10 minutes+stabilization time+functional performance testing time; 4. It is recommended to conduct 5 cycles for the experimental cycle.	Widely used



Vibration step stress	1. Start the experiment with 5Grms or 10Grms as the initial vibration level; 2. Endurance vibration is carried out with a certain vibration step, usually 5Grms; 3. The retention time should be at least 10 minutes+stabilization time+functional performance testing time; 4. Gradually increase until reaching the basic technological limitations.	Widely used



Comprehensive stress test	Conduct tests simultaneously with rapid thermal cycling and vibration step stress, reflecting different vibration levels in each rapid thermal cycling test cycle, and conduct performance tests in each cycle.	Widely used