Dynamic Testing Machine

Summary

ITC57300 Dynamic Parameter Testing SystemThe host can be equipped with different test heads to perform non-destructive testing on semiconductor devices such as MOSFTs, IGBTs, Diodes, and other bipolar devices (requiring additional bias power supply and customized personality boards). The host includes various testing instruments and software required for testing and analyzing resistive/inductive switching time and switching losses,Gate charge,QrrAnd others, etctest.

Although each test head has different designs, they can be easily and quickly installed on the host. Although each test head is designed for testing a certain parameter, the personality board it is paired with can reassemble the test head to match different types of devices, packaging models, and device circuits.

function

·Test voltage: Max1200V Vdc, 200A (short-circuit testIscMax:1000A)

·Time measurement: Min1ns

·Leakage current limit monitoring

Existing testing heads

ITC57210 -Power devices MOSFETsPTest the switching time of N-channel switchhead，beautyMilitary standard MIL-STD-750, Method 3472

ITC57220 -Power devices MOSFETsAnd diodesreverse recoveryQrrtest head,beautyMilitary standard MIL-STD-750, Method 3473

ITC57230 -Power devices MOSFETsGate charge testing head,beautyMilitary standard MIL-STD-750, Method 3471.

ITC57240 - IGBT Sensory load switch time test head,beautyMilitary standard MIL-STD-750, Method 3477.

ITC57250 -short circuitcurrentEndurance testing head,beautyMilitary standard MIL-STD-750, Method 3479.

ITC57260 -Junction capacitance/gate equivalent resistance test head,standard JEDEC Standard JESD24-11